An X-Ray Sensitive CCD Camera System and Its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy

摘要:

文章预览

信息:

期刊:

编辑:

Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud

页数:

219-226

引用:

F. Fandrich and R. Köhler, "An X-Ray Sensitive CCD Camera System and Its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy", Materials Science Forum, Vols. 210-213, pp. 219-226, 1996

上线时间:

May 1996

输出:

价格:

$38.00