Photoluminescence and Backscattering Characterization of 6H SiC Implanted with Erbium and Oxygen Ions

摘要:

文章预览

信息:

期刊:

编辑:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

页数:

501-504

DOI:

10.4028/www.scientific.net/MSF.264-268.501

引用:

A. Kozanecki et al., "Photoluminescence and Backscattering Characterization of 6H SiC Implanted with Erbium and Oxygen Ions", Materials Science Forum, Vols. 264-268, pp. 501-504, 1998

上线时间:

February 1998

输出:

价格:

$38.00

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