Characterization of Silicon Carbide using Raman Spectroscopy

摘要:

文章预览

信息:

期刊:

编辑:

Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer

页数:

615-618

引用:

J.C. Burton et al., "Characterization of Silicon Carbide using Raman Spectroscopy", Materials Science Forum, Vols. 338-342, pp. 615-618, 2000

上线时间:

May 2000

输出:

价格:

$38.00