Time Resolved Photoluminescence Measurements on Noble Gas Related Defects in Silicon

摘要:

文章预览

信息:

期刊:

编辑:

G. Ferenczi

页数:

361-366

引用:

G. Bohnert et al., "Time Resolved Photoluminescence Measurements on Noble Gas Related Defects in Silicon", Materials Science Forum, Vols. 38-41, pp. 361-366, 1989

上线时间:

January 1991

输出:

价格:

$38.00

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