In-Situ Analysis of Microstress and Texture Development during Tensile Deformation of MMCs at Room Temperature and at Elevated Temperatures Using Synchrotron Radiation

摘要:

文章预览

信息:

期刊:

编辑:

A.M. Dias, J. Pina, A.C. Batista and E. Diogo

页数:

535-540

引用:

A. Pyzalla et al., "In-Situ Analysis of Microstress and Texture Development during Tensile Deformation of MMCs at Room Temperature and at Elevated Temperatures Using Synchrotron Radiation", Materials Science Forum, Vols. 404-407, pp. 535-540, 2002

上线时间:

August 2002

输出:

价格:

$38.00

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