X-Ray Microbeam Strain Measurements in Polycrystalline Films

摘要:

文章预览

信息:

期刊:

主题:

编辑:

T. Candra, Jose Maria Torralba and T. Sakai

页数:

3945-3950

DOI:

10.4028/www.scientific.net/MSF.426-432.3945

引用:

G.S. Cargill III et al., "X-Ray Microbeam Strain Measurements in Polycrystalline Films", Materials Science Forum, Vols. 426-432, pp. 3945-3950, 2003

上线时间:

August 2003

输出:

价格:

$38.00

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