XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces
The adsorptive on pure iron and copper surfaces was investigated with angle resolved X-ray photoelectron spectroscopy (ARXPS) and atomic force microscope (AFM). Organic species and a little amount of water (micro-droplets surrounded with nanometer-scale film-like-domains) were detected on the oxidized and/or hydrated metallic surfaces for both specimens and their minute structures were discussed.
S.-G. Kang and T. Kobayashi
R. G. Wang et al., "XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces", Materials Science Forum, Vols. 449-452, pp. 1025-1028, 2004