Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction

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信息:

期刊:

编辑:

R. Delhez and E.J. Mittemeijer

页数:

165-168

引用:

H.-G. Brühl and H. Rhan, "Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction", Materials Science Forum, Vols. 79-82, pp. 165-168, 1991

上线时间:

January 1991

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价格:

$41.00